“In this study, mechanical properties such as tensile properties, flexural properties, and Izod impact strength of poly(ether ether ketone) (PEEK) and poly(ether ketone) (PEK) blends at PEK concentration from 0 to 0.42 volume fraction were studied. The blends of PEEK and PEK of different compositions were prepared by extrusion in a
single-screw extruder. With increase in the PEK concentrations, the tensile strength, flexural strength, and modulus increased Nepicastat datasheet whereas the tensile modulus and the impact strength decreased. Homogeneous dispersion and adhesion of PEK in PEEK was shown by the morphological studies. Crystallinity of blends influenced the tensile modulus and the impact strength. Using simple models to relate normalized tensile parameters where the data were divided by the crystallinity of the blends and of the PEEK matrix, respectively, supported the experimental results. (C) 2010 Wiley
Periodicals, Inc. J Appl Polym Sci 1.17: 849-856, 2010″
“PURPOSE: To report wavy horizontal artifacts on optical coherence tomography (OCT) monitor images
SETTING: Tokyo Dental College Suidobashi Hospital, Department of Ophthalmology, Tokyo, Japan
METHODS: The line-scanning ophthalmoscopy images from an OCT device of eyes that had uneventful cataract extraction with implantation of a diffractive multifocal intraocular lens (IOL) were evaluated. The images were compared with those of eyes that had cataract surgery with implantation of a monofocal IOL.
RESULTS: The study evaluated 38 eyes of eFT-508 research buy 19 patients with a diffractive multitocal IOL and 29 eyes of 18 patients with a monofocal IOL. Wavy horizontal artifacts were seen in all eyes with a multifocal
IOL but not in any image of eyes with a monofocal IOL (P<.0001, Fisher exact probability test). The OCT images, fundoscopic photographs, BMS 345541 and scanning-laser ophthalmoscopy images were unaffected by the multifocal IOLs.
CONCLUSION: The aberrations in the images from line-scanning ophthalmoscopy may have been caused by the optical design of the diffractive multifocal IOLs.”
“Nanoscale vertical interconnect structures (vias) made from chemical vapor deposited carbon have been investigated. The vias and wires were created by pyrolytic carbon deposition from acetylene at 950 degrees C followed by electron beam lithography and reactive ion etching. The carbon layer exhibits a resistivity of 4.5 m Omega cm in vias and wires which decreases to 1.5 m cm after annealing at 1000 degrees C. The resistivity does not show any size effect in the vias, as it is independent of the diameter from 85 nm down to 24 nm. The maximum current density in long carbon wires was found to be 6×10(6) A cm(-2), increasing to 3.5×10(8) A cm(-2) for short vias. (C) 2010 American Institute of Physics. [doi:10.1063/1.